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XRF-Spectrometer LXRF-A10 is a microprocessor controlled high-count throughput unit with low detection limits for wide range of elements. Provision of multi-elemental analysis with detection limits upto 1 ppm. Built-in movable platform for easy location of testing point.High resolution detector improves analysis accuracy. Equipped with safety features of optical tube shielding with no X-ray radiation and high voltage emergency locking.
Available Range :
Measureable elements : S to U Analytical Method : Energy dispersive X-ray fluorescence analytical Method Analytical Method : Energy dispersive X-ray fluorescence analytical Method| Measureable elements | S to U |
| Detection limit | 1 ppm |
| Temperature | 15 ~ 30 °C |
| Elemental content | 1 ppm to 99 % |
| Repeatability | 0.001 |
| Stability | 0.001 |
| Power supply | AC 220 V ± 5 V |
| Dimensions | 550 x 410 x 320 mm |
| Weight | 45 kg |
- Detection limit – 1 ppm
- Measureable elements – S to U
- Elemental content – 1 ppm to 99 %
- Movable sample platform for easy detection of testing point
- Built-in electric cooling Si-PIN detector
- Safety features - optical tube shielding with no X-ray radiation and high voltage emergency locking
Used in detection of plating thickness of metals, concentration of plating solution , RoHS detection and analysis, full-element analysis and electro plating industries
ICP Spectrometer
ICP spectrometer LICP-A10
- Wavelength range ( 3600 lines / mm )
- 180 to 500 nm
- Wavelength range ( 2400 lines / mm )
- 180 to 800 nm
- Temperature
- 20 ~ 28 °C
ICP Spectrometer LICP-A11
- Wavelength range
- 180 to 900 nm
- Elements per minute
- 15 elements
- Temperature
- 29 °C
ICP Spectrometer LICP-B10
- Monochromator Specifications
- Czerny turner
- Solid State Power Specifications
- 27.12 MHz Frequency stability: < 0.05%
- Technical Specifications
- Liquid sample: 0.01 ppm to several thousand ppm Solid or power sample: 0.001% to 70%
XRF Spectrometer
Handheld XRF Spectrometer LXRF-B10
- Analytical Method
- Energy dispersive X-ray fluorescence analytical Method
- Elements Measuring
- Atomic number from 12 to 92 [elements from magnesium (Mg) to uranium (U)] can be measured
- Range
- Simultaneous detector
Handheld XRF Spectrometer LXRF-B11
- Analytical Method
- Energy dispersive X-ray fluorescence analytical Method
- Elements Measuring
- Atomic number from 12 to 92 [elements from magnesium (Mg) to uranium (U)] can be measured
- Range
- Simultaneous detector
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